Strain tuning of ferroelectric thin films

Darrell G. Schlom, Long Qing Chen, Chang Beom Eom, Karin M. Rabe, Stephen K. Streiffer, Jean Marc Triscone

Research output: Chapter in Book/Report/Conference proceedingChapter

960 Scopus citations


Predictions and measurements of the effect of biaxial strain on the properties of epitaxial ferroelectric thin films and superlattices are reviewed. Results for single-layer ferroelectric films of biaxially strained SrTiO 3, BaTiO3, and PbTiO3 as well as PbTi03/SrTi03 and BaTiO3/SrTiO3 superlattices are described. Theoretical approaches, including first principles, thermodynamic analysis, and phase-field models, are applied to these biaxially strained materials, the assumptions and limitations of each technique are explained, and the predictions are compared. Measurements of the effect of biaxial strain on the paraelectric-to- ferroelectric transition temperature (TC) are shown, demonstrating the ability of percent-level strains to shift TC by hundreds of degrees in agreement with the predictions that predated such experiments. Along the way, important experimental techniques for characterizing the properties of strained ferroelectric thin films and superlattices, as well as appropriate substrates on which to grow them, are mentioned.

Original languageEnglish (US)
Title of host publicationAnnual Review of Materials Research
EditorsDavid Clarke, Manfred Ruehle, Venkatraman Gopalan
Number of pages38
StatePublished - 2007

Publication series

NameAnnual Review of Materials Research
ISSN (Print)1531-7331

All Science Journal Classification (ASJC) codes

  • General Materials Science


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