Stress-induced frequency shifts in rotated Y-cut langasite resonators with electrodes considered

Yun Jing; Jin Chen; Xun Gong; Jie Duan

doi:10.1109/TUFFC.2007.335

Stress-induced frequency shifts in rotated Y-cut langasite resonators with electrodes considered

Yun Jing
, Jin Chen
, Xun Gong
, Jie Duan

Graduate Program in Acoustics

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

Abstract

Stress-induced frequency shifts of the thicknessshear vibration of rotated Y-cut langasite resonators are studied with the electrode considered. The relationship between mass loading and force-frequency coefficients is explored for several kinds of electrode materials. Comparisons between Y-cut langasite and AT-cut quartz resonators are also presented.

Original language	English (US)
Pages (from-to)	906-909
Number of pages	4
Journal	IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
Volume	54
Issue number	5
DOIs	https://doi.org/10.1109/TUFFC.2007.335
State	Published - May 2007

All Science Journal Classification (ASJC) codes

Instrumentation
Acoustics and Ultrasonics
Electrical and Electronic Engineering

Access to Document

10.1109/TUFFC.2007.335

Cite this

@article{9ee51336241947f4903d49b0fee3553a,

title = "Stress-induced frequency shifts in rotated Y-cut langasite resonators with electrodes considered",

abstract = "Stress-induced frequency shifts of the thicknessshear vibration of rotated Y-cut langasite resonators are studied with the electrode considered. The relationship between mass loading and force-frequency coefficients is explored for several kinds of electrode materials. Comparisons between Y-cut langasite and AT-cut quartz resonators are also presented.",

author = "Yun Jing and Jin Chen and Xun Gong and Jie Duan",

note = "Funding Information: The authors wish to thank Professor Jiashi Yang (UNL) for many helpful discussions and suggestions. This work was supported in part by the Natural Science Foundation (10404014) of China.",

year = "2007",

month = may,

doi = "10.1109/TUFFC.2007.335",

language = "English (US)",

volume = "54",

pages = "906--909",

journal = "IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control",

issn = "0885-3010",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "5",

}

TY - JOUR

T1 - Stress-induced frequency shifts in rotated Y-cut langasite resonators with electrodes considered

AU - Jing, Yun

AU - Chen, Jin

AU - Gong, Xun

AU - Duan, Jie

N1 - Funding Information: The authors wish to thank Professor Jiashi Yang (UNL) for many helpful discussions and suggestions. This work was supported in part by the Natural Science Foundation (10404014) of China.

PY - 2007/5

Y1 - 2007/5

N2 - Stress-induced frequency shifts of the thicknessshear vibration of rotated Y-cut langasite resonators are studied with the electrode considered. The relationship between mass loading and force-frequency coefficients is explored for several kinds of electrode materials. Comparisons between Y-cut langasite and AT-cut quartz resonators are also presented.

AB - Stress-induced frequency shifts of the thicknessshear vibration of rotated Y-cut langasite resonators are studied with the electrode considered. The relationship between mass loading and force-frequency coefficients is explored for several kinds of electrode materials. Comparisons between Y-cut langasite and AT-cut quartz resonators are also presented.

UR - https://www.scopus.com/pages/publications/34250196514

UR - https://www.scopus.com/pages/publications/34250196514#tab=citedBy

U2 - 10.1109/TUFFC.2007.335

DO - 10.1109/TUFFC.2007.335

M3 - Article

C2 - 17523554

AN - SCOPUS:34250196514

SN - 0885-3010

VL - 54

SP - 906

EP - 909

JO - IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

JF - IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

IS - 5

ER -

Stress-induced frequency shifts in rotated Y-cut langasite resonators with electrodes considered

Abstract

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Fingerprint

Cite this