Keyphrases
Sputtered Neutral
100%
Neutral Molecules
100%
Secondary Ion
100%
Molecular Depth Profiling
100%
Photoionization
100%
Strong Field
100%
Depth Profile
75%
Guanine
50%
Molecular Ions
50%
Neutral Component
50%
Ionization Probability
50%
Mass Spectrometry Detection
25%
Mass Spectrometry
25%
Layer Thickness
25%
Fragment Ions
25%
Ion Beam
25%
Proton
25%
Chemical Composition
25%
Chemical Damage
25%
Femtosecond
25%
Cluster Ion Beam
25%
Steady-state Value
25%
Strained Layers
25%
Ion Signal
25%
C60+
25%
Organic Thin Films
25%
Depth-dependent
25%
Damage Accumulation
25%
Ag Substrate
25%
Spectrometric Data
25%
Chemical Mixing
25%
Chemistry
Secondary Ion
100%
Depth Profiling
100%
Photoionization
100%
Guanine
75%
Ion Beam
50%
Molecular Ion
50%
Phase Composition
25%
Mass Spectrometry
25%
Cluster Ion
25%
Material Science
Thin Films
100%
Mass Spectrometry
100%