Structural and magnetic properties of biaxially textured NiFe 2O4 thin films grown on c-plane sapphire

Safoura Seifikar; Bridget Calandro; Elisabeth Deeb; Edward Sachet; Jijin Yang; Jon Paul Maria; Nazanin Bassiri-Gharb; Justin Schwartz

doi:10.1063/1.4770366

Structural and magnetic properties of biaxially textured NiFe ₂O₄ thin films grown on c-plane sapphire

Safoura Seifikar, Bridget Calandro, Elisabeth Deeb, Edward Sachet, Jijin Yang, Jon Paul Maria, Nazanin Bassiri-Gharb, Justin Schwartz

Research output: Contribution to journal › Article › peer-review

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Abstract

Chemical solution deposition is used to grow biaxially textured NiFe ₂O₄ (NFO) thin films on (0001) sapphire substrates; a high degree of out-of-plane orientation in the 〈111〉 direction is confirmed by θ-2θ X-ray diffraction and pole figures. X-ray φ-scanning indicates in-plane texture and an epitaxial relationship between NFO (111) and Al₂O₃ (0001) in two crystallographic variants. The out-of-plane magnetization exhibits improved M_r/M _s from 0.5 in 110 nm-thick films to 0.8 in 60 nm-thick films. Compared to uniaxially textured NFO films on platinized silicon, the out-of-plane coercivity is reduced by 20%. The improved out-of-plane magnetic anisotropy is comparable to epitaxial NFO films of similar thickness deposited by pulsed laser deposition and sputtering.

Original language	English (US)
Article number	123910
Journal	Journal of Applied Physics
Volume	112
Issue number	12
DOIs	https://doi.org/10.1063/1.4770366
State	Published - Dec 15 2012

All Science Journal Classification (ASJC) codes

Physics and Astronomy(all)

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10.1063/1.4770366

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title = "Structural and magnetic properties of biaxially textured NiFe 2O4 thin films grown on c-plane sapphire",

abstract = "Chemical solution deposition is used to grow biaxially textured NiFe 2O4 (NFO) thin films on (0001) sapphire substrates; a high degree of out-of-plane orientation in the 〈111〉 direction is confirmed by θ-2θ X-ray diffraction and pole figures. X-ray φ-scanning indicates in-plane texture and an epitaxial relationship between NFO (111) and Al2O3 (0001) in two crystallographic variants. The out-of-plane magnetization exhibits improved Mr/M s from 0.5 in 110 nm-thick films to 0.8 in 60 nm-thick films. Compared to uniaxially textured NFO films on platinized silicon, the out-of-plane coercivity is reduced by 20%. The improved out-of-plane magnetic anisotropy is comparable to epitaxial NFO films of similar thickness deposited by pulsed laser deposition and sputtering.",

author = "Safoura Seifikar and Bridget Calandro and Elisabeth Deeb and Edward Sachet and Jijin Yang and Maria, {Jon Paul} and Nazanin Bassiri-Gharb and Justin Schwartz",

note = "Funding Information: This work supported by the U.S. National Science Foundation under Grant CMMI-0927689. The authors thank the Analytical Instrumentation Facility at NCSU for XRD measurements.",

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doi = "10.1063/1.4770366",

language = "English (US)",

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AU - Seifikar, Safoura

AU - Calandro, Bridget

AU - Deeb, Elisabeth

AU - Sachet, Edward

AU - Yang, Jijin

AU - Maria, Jon Paul

AU - Bassiri-Gharb, Nazanin

AU - Schwartz, Justin

N1 - Funding Information: This work supported by the U.S. National Science Foundation under Grant CMMI-0927689. The authors thank the Analytical Instrumentation Facility at NCSU for XRD measurements.

PY - 2012/12/15

Y1 - 2012/12/15

N2 - Chemical solution deposition is used to grow biaxially textured NiFe 2O4 (NFO) thin films on (0001) sapphire substrates; a high degree of out-of-plane orientation in the 〈111〉 direction is confirmed by θ-2θ X-ray diffraction and pole figures. X-ray φ-scanning indicates in-plane texture and an epitaxial relationship between NFO (111) and Al2O3 (0001) in two crystallographic variants. The out-of-plane magnetization exhibits improved Mr/M s from 0.5 in 110 nm-thick films to 0.8 in 60 nm-thick films. Compared to uniaxially textured NFO films on platinized silicon, the out-of-plane coercivity is reduced by 20%. The improved out-of-plane magnetic anisotropy is comparable to epitaxial NFO films of similar thickness deposited by pulsed laser deposition and sputtering.

AB - Chemical solution deposition is used to grow biaxially textured NiFe 2O4 (NFO) thin films on (0001) sapphire substrates; a high degree of out-of-plane orientation in the 〈111〉 direction is confirmed by θ-2θ X-ray diffraction and pole figures. X-ray φ-scanning indicates in-plane texture and an epitaxial relationship between NFO (111) and Al2O3 (0001) in two crystallographic variants. The out-of-plane magnetization exhibits improved Mr/M s from 0.5 in 110 nm-thick films to 0.8 in 60 nm-thick films. Compared to uniaxially textured NFO films on platinized silicon, the out-of-plane coercivity is reduced by 20%. The improved out-of-plane magnetic anisotropy is comparable to epitaxial NFO films of similar thickness deposited by pulsed laser deposition and sputtering.

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Structural and magnetic properties of biaxially textured NiFe ₂O₄ thin films grown on c-plane sapphire

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