Structural characterization and microwave loss of Nd1.85Ce 0.15CuO4-y superconducting thin films on yttria-stabilized zirconia buffered sapphire

S. N. Mao; X. X. Xi; Jian Mao; D. H. Wu; Qi Li; S. M. Anlage; T. Venkatesan; D. Prasad Beesabathina; L. Salamanca-Riba; X. D. Wu

doi:10.1063/1.111152

Structural characterization and microwave loss of Nd_1.85Ce _0.15CuO_4-y superconducting thin films on yttria-stabilized zirconia buffered sapphire

S. N. Mao, X. X. Xi, Jian Mao, D. H. Wu, Qi Li, S. M. Anlage, T. Venkatesan, D. Prasad Beesabathina, L. Salamanca-Riba, X. D. Wu

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Abstract

We have grown superconducting Nd_1.85Ce_0.15CuO _4-y (NCCO) thin films on (11̄02) sapphire using a yttria-stabilized zirconia (YSZ) buffer layer, which has been demonstrated to be the best material for the growth of n-type superconducting NCCO thin films. The films are c-axis oriented, epitaxially grown with a small mosaic spread of 0.2°and a Rutherford backscattering spectroscopy channeling yield of ∼9%. Cross-sectional transmission electron microscopy images reveal a sharp interface between NCCO and YSZ. The microwave surface resistance of NCCO films on YSZ buffered sapphire at 9.6 GHz is only 80 μΩ at 4.2 K in zero magnetic field, which is comparable to Y₁Ba₂Cu ₃O_7-y films at similar reduced temperature, as a consequence of the decrease of structural imperfection in the film. The temperature dependence of the surface resistance and magnetic penetration depth in these films further confirms the s-wave BCS nature of NCCO.

Original language	English (US)
Pages (from-to)	375-377
Number of pages	3
Journal	Applied Physics Letters
Volume	64
Issue number	3
DOIs	https://doi.org/10.1063/1.111152
State	Published - 1994

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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10.1063/1.111152

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@article{b683fe305c9e4406b6e801066d22de26,

title = "Structural characterization and microwave loss of Nd1.85Ce 0.15CuO4-y superconducting thin films on yttria-stabilized zirconia buffered sapphire",

abstract = "We have grown superconducting Nd1.85Ce0.15CuO 4-y (NCCO) thin films on (1{\=1}02) sapphire using a yttria-stabilized zirconia (YSZ) buffer layer, which has been demonstrated to be the best material for the growth of n-type superconducting NCCO thin films. The films are c-axis oriented, epitaxially grown with a small mosaic spread of 0.2°and a Rutherford backscattering spectroscopy channeling yield of ∼9%. Cross-sectional transmission electron microscopy images reveal a sharp interface between NCCO and YSZ. The microwave surface resistance of NCCO films on YSZ buffered sapphire at 9.6 GHz is only 80 μΩ at 4.2 K in zero magnetic field, which is comparable to Y1Ba2Cu 3O7-y films at similar reduced temperature, as a consequence of the decrease of structural imperfection in the film. The temperature dependence of the surface resistance and magnetic penetration depth in these films further confirms the s-wave BCS nature of NCCO.",

author = "Mao, {S. N.} and Xi, {X. X.} and Jian Mao and Wu, {D. H.} and Qi Li and Anlage, {S. M.} and T. Venkatesan and Beesabathina, {D. Prasad} and L. Salamanca-Riba and Wu, {X. D.}",

year = "1994",

doi = "10.1063/1.111152",

language = "English (US)",

volume = "64",

pages = "375--377",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

number = "3",

}

TY - JOUR

T1 - Structural characterization and microwave loss of Nd1.85Ce 0.15CuO4-y superconducting thin films on yttria-stabilized zirconia buffered sapphire

AU - Mao, S. N.

AU - Xi, X. X.

AU - Mao, Jian

AU - Wu, D. H.

AU - Li, Qi

AU - Anlage, S. M.

AU - Venkatesan, T.

AU - Beesabathina, D. Prasad

AU - Salamanca-Riba, L.

AU - Wu, X. D.

PY - 1994

Y1 - 1994

N2 - We have grown superconducting Nd1.85Ce0.15CuO 4-y (NCCO) thin films on (11̄02) sapphire using a yttria-stabilized zirconia (YSZ) buffer layer, which has been demonstrated to be the best material for the growth of n-type superconducting NCCO thin films. The films are c-axis oriented, epitaxially grown with a small mosaic spread of 0.2°and a Rutherford backscattering spectroscopy channeling yield of ∼9%. Cross-sectional transmission electron microscopy images reveal a sharp interface between NCCO and YSZ. The microwave surface resistance of NCCO films on YSZ buffered sapphire at 9.6 GHz is only 80 μΩ at 4.2 K in zero magnetic field, which is comparable to Y1Ba2Cu 3O7-y films at similar reduced temperature, as a consequence of the decrease of structural imperfection in the film. The temperature dependence of the surface resistance and magnetic penetration depth in these films further confirms the s-wave BCS nature of NCCO.

AB - We have grown superconducting Nd1.85Ce0.15CuO 4-y (NCCO) thin films on (11̄02) sapphire using a yttria-stabilized zirconia (YSZ) buffer layer, which has been demonstrated to be the best material for the growth of n-type superconducting NCCO thin films. The films are c-axis oriented, epitaxially grown with a small mosaic spread of 0.2°and a Rutherford backscattering spectroscopy channeling yield of ∼9%. Cross-sectional transmission electron microscopy images reveal a sharp interface between NCCO and YSZ. The microwave surface resistance of NCCO films on YSZ buffered sapphire at 9.6 GHz is only 80 μΩ at 4.2 K in zero magnetic field, which is comparable to Y1Ba2Cu 3O7-y films at similar reduced temperature, as a consequence of the decrease of structural imperfection in the film. The temperature dependence of the surface resistance and magnetic penetration depth in these films further confirms the s-wave BCS nature of NCCO.

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Structural characterization and microwave loss of Nd_1.85Ce _0.15CuO_4-y superconducting thin films on yttria-stabilized zirconia buffered sapphire

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