Structural characterization of molecular-beam epitaxially grown Zn1-xMnxSe and Zn1-xMnxSe/ZnSe superlattices

S. B. Qadri; N. Samarth

doi:10.1116/1.576820

Structural characterization of molecular-beam epitaxially grown Zn₁_-_xMn_xSe and Zn_1-xMnxSe/ZnSe superlattices

S. B. Qadri, N. Samarth

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2 Scopus citations

Abstract

Epitaxially grown Zn_1-xMn_xSe and its superlattices with ZnSe have been characterized by x-ray diffraction techniques. Rocking curves of the (004) and (115) reflections were measured using parallel configuration. Values of unit cell parameters perpendicular to the substrate surface were obtained from the (004) and (006) reflections. The lattice parameter parallel to the substrate surface was obtained from the (444) and (115) reflections. The superlattices of (Zn, Mn)Se and ZnSe exhibit considerable tetragonal distortion and have significantly fewer dislocations than (Zn, Mn)Se films for the same Mn composition.

Original language	English (US)
Pages (from-to)	1884-1887
Number of pages	4
Journal	Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume	8
Issue number	3
DOIs	https://doi.org/10.1116/1.576820
State	Published - May 1990

All Science Journal Classification (ASJC) codes

Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films

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abstract = "Epitaxially grown Zn1-xMnxSe and its superlattices with ZnSe have been characterized by x-ray diffraction techniques. Rocking curves of the (004) and (115) reflections were measured using parallel configuration. Values of unit cell parameters perpendicular to the substrate surface were obtained from the (004) and (006) reflections. The lattice parameter parallel to the substrate surface was obtained from the (444) and (115) reflections. The superlattices of (Zn, Mn)Se and ZnSe exhibit considerable tetragonal distortion and have significantly fewer dislocations than (Zn, Mn)Se films for the same Mn composition.",

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AU - Qadri, S. B.

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PY - 1990/5

Y1 - 1990/5

N2 - Epitaxially grown Zn1-xMnxSe and its superlattices with ZnSe have been characterized by x-ray diffraction techniques. Rocking curves of the (004) and (115) reflections were measured using parallel configuration. Values of unit cell parameters perpendicular to the substrate surface were obtained from the (004) and (006) reflections. The lattice parameter parallel to the substrate surface was obtained from the (444) and (115) reflections. The superlattices of (Zn, Mn)Se and ZnSe exhibit considerable tetragonal distortion and have significantly fewer dislocations than (Zn, Mn)Se films for the same Mn composition.

AB - Epitaxially grown Zn1-xMnxSe and its superlattices with ZnSe have been characterized by x-ray diffraction techniques. Rocking curves of the (004) and (115) reflections were measured using parallel configuration. Values of unit cell parameters perpendicular to the substrate surface were obtained from the (004) and (006) reflections. The lattice parameter parallel to the substrate surface was obtained from the (444) and (115) reflections. The superlattices of (Zn, Mn)Se and ZnSe exhibit considerable tetragonal distortion and have significantly fewer dislocations than (Zn, Mn)Se films for the same Mn composition.

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Structural characterization of molecular-beam epitaxially grown Zn₁_-_xMn_xSe and Zn_1-xMnxSe/ZnSe superlattices

Abstract

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