Structural identification of recombinant HEV VLP C-terminus

C. Y.J. Wang, L. Xing, T. C. Li, N. Takeda, Y. Yasutomi, D. J. Schofield, S. U. Emerson, R. H. Purcell, T. Miyamura, R. H. Cheng

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)416-417
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
StatePublished - Aug 2006

All Science Journal Classification (ASJC) codes

  • Instrumentation

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