Structural modification of Ge-Se amorphous films with the addition of Sb

A. Ganjoo, H. Jain, S. Khalid, C. G. Pantano

Research output: Contribution to journalArticlepeer-review

38 Scopus citations


Extended X-ray absorption fine-structure (EXAFS) measurements were undertaken to understand the structural modification of amorphous Ge-Se films that occurs with the addition of Sb. We found that Ge-Ge bonds exist along with Ge-Se bonds in Ge-rich Ge-Se films. These bonds disappear with increasing Se content, to the extent that Ge-Se bonds predominate in stoichiometric GeSe 2 films. When Ge is replaced by Sb, stable Sb-Se bonds are formed; concurrently, the proportion of Ge-Ge bonds is decreased at the expense of Ge-Se bonds. As a result, GeSbSe glasses have a more stable and stronger network structure.

Original languageEnglish (US)
Pages (from-to)503-512
Number of pages10
JournalPhilosophical Magazine Letters
Issue number10
StatePublished - Oct 2005

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics


Dive into the research topics of 'Structural modification of Ge-Se amorphous films with the addition of Sb'. Together they form a unique fingerprint.

Cite this