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Structural properties of thin-film ferromagnetic topological insulators
C. L. Richardson
, J. M. Devine-Stoneman
, G. Divitini
, M. E. Vickers
,
C. Z. Chang
, M. Amado
, J. S. Moodera
, J. W.A. Robinson
Materials Research Institute (MRI)
Research output
:
Contribution to journal
›
Article
›
peer-review
6
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Scopus citations
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Keyphrases
In Films
100%
Structural Properties
100%
Thin Film Properties
100%
Ferromagnetic Topological Insulator
100%
Energy Dispersive X-ray Spectroscopy
50%
Bismuth Telluride
50%
BiSb
50%
Si(111)
50%
Electron Energy
50%
Scanning Transmission Electron Microscopy
50%
C-axis
50%
Edge States
50%
Doping Level
50%
Film Thickness
50%
Spectroscopic Measurement
50%
Lattice Parameter
50%
High-resolution X-ray Diffraction (HRXRD)
50%
Plane Lattices
50%
Quantum Anomalous Hall Effect
50%
Topological Quantum Computation
50%
Qubit
50%
Spintronics
50%
Doping Effect
50%
Quintuple Layers
50%
Spin Filter
50%
Substrate Choice
50%
Physics
Thin Films
100%
Topological Insulator
100%
High Resolution
50%
Electron Energy
50%
Transmission Electron Microscopy
50%
X Ray Spectroscopy
50%
Film Thickness
50%
Spintronics
50%
Quantum Dot
50%
X-Ray Diffraction
50%
Quantum Computing
50%
Crystal Structure
50%
Lattice Parameter
50%
Engineering
Thin Films
100%
Structural Property
100%
High Resolution
50%
Magnetoelectronics
50%
Substrate Material
50%
Doping Level
50%
Qubit
50%
Crystal Structure
50%
Quantum Computation
50%
Lattice Constant
50%
Lattice Parameter
50%
Material Science
Film
100%
Thin Films
100%
Structural Property
100%
Vanadium
50%
Energy-Dispersive X-Ray Spectroscopy
50%
Scanning Transmission Electron Microscopy
50%
X Ray Diffraction Analysis
50%
Lattice Constant
50%
Film Thickness
50%
Crystal Structure
50%