Structure and piezoelectric properties of sol-gel-derived 0.5 Pb[Yb _1/2Nb_1/2]O₃-0.5 PbTiO₃ thin films

Keyphrases

• Silica 100%
• X-ray 100%
• Piezoelectric Properties 100%
• Dielectric Permittivity 100%
• Sol-gel 100%
• Si Substrate 100%
• Dielectric Loss 100%
• PbTiO3 Thin Film 100%
• Structure Properties 100%
• Diffraction 50%
• Wafer 50%
• Ferroelectric Properties 50%
• Sol-gel Processing 50%
• Remanent Polarization 50%
• Seed Layer 50%
• Loss Factor 50%
• (111)-oriented 50%
• Flexure 50%
• Uniform Grain Size 50%
• Pyrochlore Phase 50%
• Scanning Electron Microscopy (SEM-EDS) 50%
• Diffraction Analysis 50%

Material Science

• Film 100%
• Thin Films 100%
• Piezoelectric Property 100%
• Sol-Gel 100%
• Permittivity 50%
• Grain Size 25%
• Piezoelectricity 25%
• Ferroelectricity 25%
• Sol-Gel Processing 25%
• Scanning Electron Microscopy 25%
• X Ray Diffraction Analysis 25%
• Dielectric Material 25%