Structure-property relationships in SrRuO3 epitaxial thin films

J. P. Maria; S. Trolier-McKinstry; D. G. Schlom

doi:10.1557/proc-474-217

Structure-property relationships in SrRuO₃ epitaxial thin films

J. P. Maria, S. Trolier-McKinstry, D. G. Schlom

Research output: Contribution to journal › Conference article › peer-review

Abstract

Epitaxial SrRuO₃ films were prepared on (001) SrTiO₃ substrates by pulsed laser deposition. The film structure was characterized by 4-circle x-ray diffraction and the electrical behavior by temperature dependent resistivity measurements. With variations in the deposition conditions, significant changes in both structural and electrical properties were observed. When deposited under conditions favoring appreciable energetic bombardment, the SrRuO₃ films on SrTiO₃ exhibited extended in and out-of-plane lattice constants and increased values of resistivity; in addition, a depression of the Curie temperature was measured. SrRuO₃ deposited under less aggressive conditions displayed structures and properties more similar to those associated with bulk crystals.

Original language	English (US)
Pages (from-to)	217-222
Number of pages	6
Journal	Materials Research Society Symposium - Proceedings
Volume	477
DOIs	https://doi.org/10.1557/proc-474-217
State	Published - 1997
Event	Proceedings of the 1997 MRS Spring Meeting - San Francisco, CA, USA Duration: Mar 31 1997 → …

All Science Journal Classification (ASJC) codes

Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering
General Materials Science

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title = "Structure-property relationships in SrRuO3 epitaxial thin films",

abstract = "Epitaxial SrRuO3 films were prepared on (001) SrTiO3 substrates by pulsed laser deposition. The film structure was characterized by 4-circle x-ray diffraction and the electrical behavior by temperature dependent resistivity measurements. With variations in the deposition conditions, significant changes in both structural and electrical properties were observed. When deposited under conditions favoring appreciable energetic bombardment, the SrRuO3 films on SrTiO3 exhibited extended in and out-of-plane lattice constants and increased values of resistivity; in addition, a depression of the Curie temperature was measured. SrRuO3 deposited under less aggressive conditions displayed structures and properties more similar to those associated with bulk crystals.",

author = "Maria, {J. P.} and S. Trolier-McKinstry and Schlom, {D. G.}",

year = "1997",

doi = "10.1557/proc-474-217",

language = "English (US)",

volume = "477",

pages = "217--222",

journal = "Materials Research Society Symposium - Proceedings",

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publisher = "Materials Research Society",

note = "Proceedings of the 1997 MRS Spring Meeting ; Conference date: 31-03-1997",

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TY - JOUR

T1 - Structure-property relationships in SrRuO3 epitaxial thin films

AU - Maria, J. P.

AU - Trolier-McKinstry, S.

AU - Schlom, D. G.

PY - 1997

Y1 - 1997

N2 - Epitaxial SrRuO3 films were prepared on (001) SrTiO3 substrates by pulsed laser deposition. The film structure was characterized by 4-circle x-ray diffraction and the electrical behavior by temperature dependent resistivity measurements. With variations in the deposition conditions, significant changes in both structural and electrical properties were observed. When deposited under conditions favoring appreciable energetic bombardment, the SrRuO3 films on SrTiO3 exhibited extended in and out-of-plane lattice constants and increased values of resistivity; in addition, a depression of the Curie temperature was measured. SrRuO3 deposited under less aggressive conditions displayed structures and properties more similar to those associated with bulk crystals.

AB - Epitaxial SrRuO3 films were prepared on (001) SrTiO3 substrates by pulsed laser deposition. The film structure was characterized by 4-circle x-ray diffraction and the electrical behavior by temperature dependent resistivity measurements. With variations in the deposition conditions, significant changes in both structural and electrical properties were observed. When deposited under conditions favoring appreciable energetic bombardment, the SrRuO3 films on SrTiO3 exhibited extended in and out-of-plane lattice constants and increased values of resistivity; in addition, a depression of the Curie temperature was measured. SrRuO3 deposited under less aggressive conditions displayed structures and properties more similar to those associated with bulk crystals.

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DO - 10.1557/proc-474-217

M3 - Conference article

AN - SCOPUS:0031341571

SN - 0272-9172

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EP - 222

JO - Materials Research Society Symposium - Proceedings

JF - Materials Research Society Symposium - Proceedings

T2 - Proceedings of the 1997 MRS Spring Meeting

Y2 - 31 March 1997

ER -

Structure-property relationships in SrRuO₃ epitaxial thin films

Abstract

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