Studies of AC BTI Stress in 4H SiC MOSFETs

Keyphrases

• MOSFET 100%
• 4H-SiC 100%
• Carbide Metal 100%
• Commercially Available 50%
• Stress-induced 50%
• Interfacial Traps 50%
• Stress Signaling 50%
• Threshold Voltage 50%
• Subthreshold Swing 50%
• Voltage Swing 50%
• Silicon Carbide 50%
• Signal Amplitude 50%
• Signal Frequency 50%
• AC Stress 50%

Engineering

• Metal-Oxide-Semiconductor Field-Effect Transistor 100%
• Induced Stress 50%
• Polytypes 50%

Material Science

• Metal-Oxide-Semiconductor Field-Effect Transistor 100%
• Silicon Carbide 100%