Sub-grain orientation resolution during continuous loading using only far-field HEDM

K. E. Nygren, D. C. Pagan, M. P. Miller

Research output: Contribution to journalConference articlepeer-review

8 Scopus citations


A far-field data reduction algorithm for high-energy X-ray diffraction microscopy (HEDM) has been adapted to extract sub-grain orientation descriptors in a polycrystalline material during continuous in situ loading experiments. Previously, the standard data reduction algorithm would only extract grain-averaged strains, orientation, and the centroid position. A new descriptor, the grain orientation envelope (GOE), is introduced as a measure of the intragranular microstructure extracted from every grain during a continuous loading experiment. Initial results showing the evolution of a GOE from one grain in the titanium alloy, Ti-7Al, during a tension test is presented as a demonstration of the nature of the data.

Original languageEnglish (US)
Article number012018
JournalIOP Conference Series: Materials Science and Engineering
Issue number1
StatePublished - Dec 9 2019
Event40th Riso International Symposium on Materials Science: Metal Microstructures in 2D, 3D and 4D - Copenhagen, Denmark
Duration: Sep 2 2019Sep 6 2019

All Science Journal Classification (ASJC) codes

  • General Materials Science
  • General Engineering


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