Abstract
Photoconductive detectors are fabricated on two different substrates: SiC substrates with a closer lattice match to GaN and thick GaN layers grown on sapphire with dislocation densities in the range of 1E8-1E9/cm2. The detectors on SiC exhibit a slightly higher responsivity and sharper wavelength cutoff than the detectors on sapphire. The dynamic range of the detectors indicate that the detectors on SiC substrates have a more linear response to intensity variations than the detectors on sapphire which have a square root dependence on the intensity.
Original language | English (US) |
---|---|
Number of pages | 1 |
Journal | LEOS Summer Topical Meeting |
State | Published - Jan 1 1997 |
Event | Proceedings of the 1997 LEOS Summer Topical Meeting - Montreal, Can Duration: Aug 11 1997 → Aug 15 1997 |
All Science Journal Classification (ASJC) codes
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering