Subsurface damage in single-crystal sapphire

F. H. Mrakovcic, J. A. Randi, J. C. Lambropoulos, S. D. Jacobs

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Subsurface damage (SSD) and material removal rates in the C, A, and M crystallographic faces of single-crystal sapphire have been examined. SSD is related to the peak-to-valley surface microroughness by SSD≤ 1.4 x PV.

Original languageEnglish (US)
Title of host publicationOptical Fabrication and Testing, OFT 2004
PublisherOptica Publishing Group (formerly OSA)
ISBN (Electronic)1557527792
StatePublished - 2004
EventOptical Fabrication and Testing, OFT 2004 - Rochester, United States
Duration: Oct 11 2004Oct 13 2004

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Conference

ConferenceOptical Fabrication and Testing, OFT 2004
Country/TerritoryUnited States
CityRochester
Period10/11/0410/13/04

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

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