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Subsurface damage in single-crystal sapphire

  • F. H. Mrakovcic
  • , J. A. Randi
  • , J. C. Lambropoulos
  • , S. D. Jacobs

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    Subsurface damage (SSD) and material removal rates in the C, A, and M crystallographic faces of single-crystal sapphire have been examined. SSD is related to the peak-to-valley surface microroughness by SSD≤ 1.4 x PV.

    Original languageEnglish (US)
    Title of host publicationOptical Fabrication and Testing, OFT 2004
    PublisherOptica Publishing Group (formerly OSA)
    ISBN (Electronic)1557527792
    StatePublished - 2004
    EventOptical Fabrication and Testing, OFT 2004 - Rochester, United States
    Duration: Oct 11 2004Oct 13 2004

    Publication series

    NameOptics InfoBase Conference Papers
    ISSN (Electronic)2162-2701

    Conference

    ConferenceOptical Fabrication and Testing, OFT 2004
    Country/TerritoryUnited States
    CityRochester
    Period10/11/0410/13/04

    All Science Journal Classification (ASJC) codes

    • Electronic, Optical and Magnetic Materials
    • Mechanics of Materials

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