TY - JOUR
T1 - Superconducting and structural properties of Nd2-xCe xCuO4-y thin films on perovskite and fluorite substrates
AU - Mao, S. N.
AU - Xi, X. X.
AU - Li, Qi
AU - Venkatesan, T.
AU - Beesabathina, D. Prasad
AU - Salamanca-Riba, L.
AU - Wu, X. D.
PY - 1994
Y1 - 1994
N2 - High quality epitaxial Nd2-xCexCuO4-y (NCCO) thin films were fabricated on various substrates by pulsed-laser deposition using N2O reactive gas. The similarities and dissimilarities of the superconducting and structural properties of NCCO films, on perovskite-type substrates such as LaAlO3, NdGaO3, and SrTiO3 and on a fluorite-type substrate of yttria-stabilized zirconia (YSZ), were investigated systematically as a function of film thickness by transport measurements and structural analysis. A remarkable reduction of T c was observed when the film was thinner than a critical thickness, which strongly depends on the substrate. The critical thicknesses for which Tc is 80% of Tc max are 1200, 1000, 600, and 450 Å for LaAlO3, NdGaO3, SrTiO3, and YSZ, respectively. YSZ turns out to be the best candidate for the growth of very thin NCCO films among the substrates studied. These results show a strong correlation between the strain and Tc in NCCO thin films and point the way to the fabrication of n-type superconducting electric field devices using ultrathin NCCO films.
AB - High quality epitaxial Nd2-xCexCuO4-y (NCCO) thin films were fabricated on various substrates by pulsed-laser deposition using N2O reactive gas. The similarities and dissimilarities of the superconducting and structural properties of NCCO films, on perovskite-type substrates such as LaAlO3, NdGaO3, and SrTiO3 and on a fluorite-type substrate of yttria-stabilized zirconia (YSZ), were investigated systematically as a function of film thickness by transport measurements and structural analysis. A remarkable reduction of T c was observed when the film was thinner than a critical thickness, which strongly depends on the substrate. The critical thicknesses for which Tc is 80% of Tc max are 1200, 1000, 600, and 450 Å for LaAlO3, NdGaO3, SrTiO3, and YSZ, respectively. YSZ turns out to be the best candidate for the growth of very thin NCCO films among the substrates studied. These results show a strong correlation between the strain and Tc in NCCO thin films and point the way to the fabrication of n-type superconducting electric field devices using ultrathin NCCO films.
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U2 - 10.1063/1.356318
DO - 10.1063/1.356318
M3 - Article
AN - SCOPUS:0344719273
SN - 0021-8979
VL - 75
SP - 2119
EP - 2124
JO - Journal of Applied Physics
JF - Journal of Applied Physics
IS - 4
ER -