Superconducting Nd1.85Ce0.15CuO4-y Thin Films and Heterostructures on Sapphire

S. N. Mao; Jian Mao; X. X. Xi; D. H. Wu; Qi Li; S. M. Anlage; T. Venkatesan; X. D. Wu

doi:10.1109/77.402813

Superconducting Nd1.85Ce0.15CuO4-y Thin Films and Heterostructures on Sapphire

S. N. Mao, Jian Mao, X. X. Xi, D. H. Wu, Qi Li, S. M. Anlage, T. Venkatesan, X. D. Wu

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

Superconducting Nd1.85Ce0.15CuO4-y (NCCO) thin films have been made on Yttria-Stabilized Zirconia(YSZ) buffered sapphire. The films are epitaxially grown and highly in-plane oriented. X-ray diffraction shows the c-axis of the film normal to the surface of the substrate. The width of rocking curve is 0.2° and the RBS channeling yield is 9%, indicating high crystallinity of the film. Cross-sectional transmission electron microscopy images reveal a sharp interface between NCCO and YSZ. The microwave surface resistance of NCCO films on YSZ buffered sapphire at 9.6 GHz was measured and a value of 80 µΩ (at 4.2 K in zero dc magnetic field) was obtained, which is comparable to Y1Ba2Cu3O7_y (YBCO) films at the same reduced temperature. A trilayer structure of YBCO/SrTiO3/ NCCO on YSZ buffered sapphire has been fabricated with all layers oriented, in which both the YBCO and NCCO layers are superconducting.

Original language	English (US)
Pages (from-to)	1347-1350
Number of pages	4
Journal	IEEE Transactions on Applied Superconductivity
Volume	5
Issue number	2
DOIs	https://doi.org/10.1109/77.402813
State	Published - Jun 1995

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering

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@article{8826a32d8bd64af58438d6a72975522f,

title = "Superconducting Nd1.85Ce0.15CuO4-y Thin Films and Heterostructures on Sapphire",

abstract = "Superconducting Nd1.85Ce0.15CuO4-y (NCCO) thin films have been made on Yttria-Stabilized Zirconia(YSZ) buffered sapphire. The films are epitaxially grown and highly in-plane oriented. X-ray diffraction shows the c-axis of the film normal to the surface of the substrate. The width of rocking curve is 0.2° and the RBS channeling yield is 9%, indicating high crystallinity of the film. Cross-sectional transmission electron microscopy images reveal a sharp interface between NCCO and YSZ. The microwave surface resistance of NCCO films on YSZ buffered sapphire at 9.6 GHz was measured and a value of 80 µΩ (at 4.2 K in zero dc magnetic field) was obtained, which is comparable to Y1Ba2Cu3O7_y (YBCO) films at the same reduced temperature. A trilayer structure of YBCO/SrTiO3/ NCCO on YSZ buffered sapphire has been fabricated with all layers oriented, in which both the YBCO and NCCO layers are superconducting.",

author = "Mao, {S. N.} and Jian Mao and Xi, {X. X.} and Wu, {D. H.} and Qi Li and Anlage, {S. M.} and T. Venkatesan and Wu, {X. D.}",

note = "Funding Information: Pambianchi, and Dr. M. Rajeswari are also appreciated. SNM is grateful to Dr. A. T. Findikoglu for simulating discussions. SMA acknowledges support by NSF ttrugh an NYI grant DMR-9258183 and NSF DMR-9123198.",

year = "1995",

month = jun,

doi = "10.1109/77.402813",

language = "English (US)",

volume = "5",

pages = "1347--1350",

journal = "IEEE Transactions on Applied Superconductivity",

issn = "1051-8223",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "2",

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T1 - Superconducting Nd1.85Ce0.15CuO4-y Thin Films and Heterostructures on Sapphire

AU - Mao, S. N.

AU - Mao, Jian

AU - Xi, X. X.

AU - Wu, D. H.

AU - Li, Qi

AU - Anlage, S. M.

AU - Venkatesan, T.

AU - Wu, X. D.

N1 - Funding Information: Pambianchi, and Dr. M. Rajeswari are also appreciated. SNM is grateful to Dr. A. T. Findikoglu for simulating discussions. SMA acknowledges support by NSF ttrugh an NYI grant DMR-9258183 and NSF DMR-9123198.

PY - 1995/6

Y1 - 1995/6

N2 - Superconducting Nd1.85Ce0.15CuO4-y (NCCO) thin films have been made on Yttria-Stabilized Zirconia(YSZ) buffered sapphire. The films are epitaxially grown and highly in-plane oriented. X-ray diffraction shows the c-axis of the film normal to the surface of the substrate. The width of rocking curve is 0.2° and the RBS channeling yield is 9%, indicating high crystallinity of the film. Cross-sectional transmission electron microscopy images reveal a sharp interface between NCCO and YSZ. The microwave surface resistance of NCCO films on YSZ buffered sapphire at 9.6 GHz was measured and a value of 80 µΩ (at 4.2 K in zero dc magnetic field) was obtained, which is comparable to Y1Ba2Cu3O7_y (YBCO) films at the same reduced temperature. A trilayer structure of YBCO/SrTiO3/ NCCO on YSZ buffered sapphire has been fabricated with all layers oriented, in which both the YBCO and NCCO layers are superconducting.

AB - Superconducting Nd1.85Ce0.15CuO4-y (NCCO) thin films have been made on Yttria-Stabilized Zirconia(YSZ) buffered sapphire. The films are epitaxially grown and highly in-plane oriented. X-ray diffraction shows the c-axis of the film normal to the surface of the substrate. The width of rocking curve is 0.2° and the RBS channeling yield is 9%, indicating high crystallinity of the film. Cross-sectional transmission electron microscopy images reveal a sharp interface between NCCO and YSZ. The microwave surface resistance of NCCO films on YSZ buffered sapphire at 9.6 GHz was measured and a value of 80 µΩ (at 4.2 K in zero dc magnetic field) was obtained, which is comparable to Y1Ba2Cu3O7_y (YBCO) films at the same reduced temperature. A trilayer structure of YBCO/SrTiO3/ NCCO on YSZ buffered sapphire has been fabricated with all layers oriented, in which both the YBCO and NCCO layers are superconducting.

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Superconducting Nd1.85Ce0.15CuO4-y Thin Films and Heterostructures on Sapphire

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