Abstract
We have studied the effect of 3He dilution on very thin superfluid 4He films using a torsional oscillator technique. Assuming that the inert layer is free of 3He, we obtain data on films with 3He concentration in the superfluid layer up to 80%. We compare our results with data available from earlier studies.
Original language | English (US) |
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Pages (from-to) | 333-334 |
Number of pages | 2 |
Journal | Physica B: Condensed Matter |
Volume | 284-288 |
Issue number | PART I |
DOIs | |
State | Published - 2000 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering