Skip to main navigation Skip to search Skip to main content

Suppression of acceptor deactivation in silicon by argon-ion implantation damage

  • S. Ashok
  • , K. Srikanth

Research output: Contribution to journalArticlepeer-review

Fingerprint

Dive into the research topics of 'Suppression of acceptor deactivation in silicon by argon-ion implantation damage'. Together they form a unique fingerprint.
Sort by

Keyphrases

Material Science