Abstract
Epitaxial Sr2RuO4 thin films grown by pulsed-laser deposition from high-purity (99.98%) Sr2RuO4 targets on (001) LaAlO3 were found to be not superconducting down to 0.4 K. Structural disorder is believed to be responsible. A correlation was observed between higher resistivity ratios in electrical transport measurements and narrower x-ray diffraction rocking curve widths of the Sr2RuO4 films. High-resolution transmission electron microscopy revealed that the dominant structural defects, i.e., the defects leading to the observed variation in rocking curve widths in the films, are {011} planar defects, with a spacing comparable to the in-plane superconducting coherence length of Sr2RuO4. These results imply that minimizing structural disorder is the key remaining challenge to achieving superconducting Sr2RuO4 films.
Original language | English (US) |
---|---|
Pages (from-to) | 2351-2353 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 78 |
Issue number | 16 |
DOIs | |
State | Published - Apr 16 2001 |
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)