Suppression of superconductivity by crystallographic defects in epitaxial Sr2RuO4 films

Mark A. Zurbuchen, Yunfa Jia, Stacy Knapp, Altaf H. Carim, Darrell G. Schlom, Zou Ling-Nian, Liu Ying

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Abstract

Epitaxial Sr2RuO4 thin films grown by pulsed-laser deposition from high-purity (99.98%) Sr2RuO4 targets on (001) LaAlO3 were found to be not superconducting down to 0.4 K. Structural disorder is believed to be responsible. A correlation was observed between higher resistivity ratios in electrical transport measurements and narrower x-ray diffraction rocking curve widths of the Sr2RuO4 films. High-resolution transmission electron microscopy revealed that the dominant structural defects, i.e., the defects leading to the observed variation in rocking curve widths in the films, are {011} planar defects, with a spacing comparable to the in-plane superconducting coherence length of Sr2RuO4. These results imply that minimizing structural disorder is the key remaining challenge to achieving superconducting Sr2RuO4 films.

Original languageEnglish (US)
Pages (from-to)2351-2353
Number of pages3
JournalApplied Physics Letters
Volume78
Issue number16
DOIs
StatePublished - Apr 16 2001

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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