Abstract
The most common techniques for surface analysis - Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), secondary-ion mass spectroscopy (SIMS), ion scattering spectroscopy (ISS), and sputter-induced photon spectroscopy (SIPS)-are discussed. Perturbing effects of the charged particle-beam probes on the surface under study are described; of particular concern are electromigration, heating, and electron-stimulated desorption. Subsequently, some studies of glass surface chemistry with XPS, ISS, SIMS, and SIPS are summarized.
| Original language | English (US) |
|---|---|
| Pages | 1154-1163, 1167 |
| Volume | 60 |
| No | 11 |
| Specialist publication | American Ceramic Society Bulletin |
| State | Published - Jan 1 1981 |
All Science Journal Classification (ASJC) codes
- Ceramics and Composites