SURFACE AND IN-DEPTH ANALYSIS OF GLASS AND CERAMICS.

Carlo G. Pantano

SURFACE AND IN-DEPTH ANALYSIS OF GLASS AND CERAMICS.

Carlo G. Pantano

Research output: Contribution to specialist publication › Article

Abstract

The most common techniques for surface analysis - Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), secondary-ion mass spectroscopy (SIMS), ion scattering spectroscopy (ISS), and sputter-induced photon spectroscopy (SIPS)-are discussed. Perturbing effects of the charged particle-beam probes on the surface under study are described; of particular concern are electromigration, heating, and electron-stimulated desorption. Subsequently, some studies of glass surface chemistry with XPS, ISS, SIMS, and SIPS are summarized.

Original language	English (US)
Pages	1154-1163, 1167
Volume	60
No	11
Specialist publication	American Ceramic Society Bulletin
State	Published - Jan 1 1981

All Science Journal Classification (ASJC) codes

Ceramics and Composites

Cite this

@misc{5cd3147057404df58e8c8f2eab53dfb0,

title = "SURFACE AND IN-DEPTH ANALYSIS OF GLASS AND CERAMICS.",

abstract = "The most common techniques for surface analysis - Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), secondary-ion mass spectroscopy (SIMS), ion scattering spectroscopy (ISS), and sputter-induced photon spectroscopy (SIPS)-are discussed. Perturbing effects of the charged particle-beam probes on the surface under study are described; of particular concern are electromigration, heating, and electron-stimulated desorption. Subsequently, some studies of glass surface chemistry with XPS, ISS, SIMS, and SIPS are summarized.",

author = "Pantano, \{Carlo G.\}",

year = "1981",

month = jan,

day = "1",

language = "English (US)",

volume = "60",

pages = "1154--1163, 1167",

journal = "American Ceramic Society Bulletin",

issn = "0002-7812",

publisher = "American Ceramic Society",

}

TY - GEN

T1 - SURFACE AND IN-DEPTH ANALYSIS OF GLASS AND CERAMICS.

AU - Pantano, Carlo G.

PY - 1981/1/1

Y1 - 1981/1/1

N2 - The most common techniques for surface analysis - Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), secondary-ion mass spectroscopy (SIMS), ion scattering spectroscopy (ISS), and sputter-induced photon spectroscopy (SIPS)-are discussed. Perturbing effects of the charged particle-beam probes on the surface under study are described; of particular concern are electromigration, heating, and electron-stimulated desorption. Subsequently, some studies of glass surface chemistry with XPS, ISS, SIMS, and SIPS are summarized.

AB - The most common techniques for surface analysis - Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), secondary-ion mass spectroscopy (SIMS), ion scattering spectroscopy (ISS), and sputter-induced photon spectroscopy (SIPS)-are discussed. Perturbing effects of the charged particle-beam probes on the surface under study are described; of particular concern are electromigration, heating, and electron-stimulated desorption. Subsequently, some studies of glass surface chemistry with XPS, ISS, SIMS, and SIPS are summarized.

UR - https://www.scopus.com/pages/publications/0019636612

UR - https://www.scopus.com/pages/publications/0019636612#tab=citedBy

M3 - Article

AN - SCOPUS:0019636612

SN - 0002-7812

VL - 60

SP - 1154-1163, 1167

JO - American Ceramic Society Bulletin

JF - American Ceramic Society Bulletin

ER -

SURFACE AND IN-DEPTH ANALYSIS OF GLASS AND CERAMICS.

Abstract

All Science Journal Classification (ASJC) codes

Other files and links

Fingerprint

Cite this