Abstract
The surfaces and interfaces of polymer films impact many performance properties including adhesion, printability, barrier performance and physical appearance. This talk will provide an overview of x-ray photoelectron spectroscopy (XPS, also known as ESCA) and time-of-flight secondary ion mass spectrometry (TOF-SIMS). These two tools are, arguably, the most powerful analytical techniques available for probing the chemical structure of polymer surfaces and interfaces. Case studies from converter films will be discussed to demonstrate these capabilities. Copyright
| Original language | English (US) |
|---|---|
| Pages | 1274-1303 |
| Number of pages | 30 |
| State | Published - 2013 |
| Event | Web Coating and Handling Conference 2013 - Charleston, SC, United States Duration: Oct 27 2013 → Oct 30 2013 |
Other
| Other | Web Coating and Handling Conference 2013 |
|---|---|
| Country/Territory | United States |
| City | Charleston, SC |
| Period | 10/27/13 → 10/30/13 |
All Science Journal Classification (ASJC) codes
- Surfaces, Coatings and Films
- Surfaces and Interfaces