TY - JOUR
T1 - Surface Roughness Modeling of Substrate Integrated Waveguide in D-Band
AU - Yi, Ming
AU - Li, Sensen
AU - Yu, Huan
AU - Khan, Wasif
AU - Ulusoy, Cagri
AU - Vera-Lopez, Aida
AU - Papapolymerou, John
AU - Swaminathan, Madhavan
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/4
Y1 - 2016/4
N2 - In this paper, surface roughness models for a substrate integrated waveguide (SIW) are proposed. Frequency-dependent conductivity is introduced to model the conductor loss due to surface roughness. To be specific, two models, namely, the modified Huray model and the rigorous waveguide model, are developed. Both models take into account the mode-dependent loss. Formulations for enhancement factor are derived for both models to calculate the frequency-dependent conductivity. Key parameters of the analytical models are extracted from the surface profile measurement. A D-band (110-170 GHz) SIW structure is fabricated using a liquid crystal polymer substrate. The simulated results are correlated with measured data of the fabricated SIW, which shows the accuracy of the proposed methods.
AB - In this paper, surface roughness models for a substrate integrated waveguide (SIW) are proposed. Frequency-dependent conductivity is introduced to model the conductor loss due to surface roughness. To be specific, two models, namely, the modified Huray model and the rigorous waveguide model, are developed. Both models take into account the mode-dependent loss. Formulations for enhancement factor are derived for both models to calculate the frequency-dependent conductivity. Key parameters of the analytical models are extracted from the surface profile measurement. A D-band (110-170 GHz) SIW structure is fabricated using a liquid crystal polymer substrate. The simulated results are correlated with measured data of the fabricated SIW, which shows the accuracy of the proposed methods.
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U2 - 10.1109/TMTT.2016.2535290
DO - 10.1109/TMTT.2016.2535290
M3 - Article
AN - SCOPUS:84979467463
SN - 0018-9480
VL - 64
SP - 1209
EP - 1216
JO - IEEE Transactions on Microwave Theory and Techniques
JF - IEEE Transactions on Microwave Theory and Techniques
IS - 4
M1 - 7426857
ER -