TY - JOUR
T1 - Surface sensitivity in cluster-ion-induced sputtering
AU - Szakal, Christopher
AU - Kozole, Joseph
AU - Russo, Michael F.
AU - Garrison, Barbara J.
AU - Winograd, Nicholas
PY - 2006
Y1 - 2006
N2 - The ion beam-induced removal of thin water ice films condensed onto Ag and bombarded by energetic Au, Au2, Au3, and C60 projectiles is examined both experimentally and with molecular dynamics computer simulations. For water overlayers of thicknesses greater than 10, the yields of sputtered Ag+ secondary ions decay exponentially with increasing ice thickness, revealing characteristic decay lengths of 24, 20, 18, and 7.0, respectively. It is shown that these values manifest the characteristic depths of projectile energy loss, rather than escape depths of the sputtered Ag atoms through the water ice overlayer. Computer simulations show that the mechanism of ejection involves the sweeping away of overlayer water molecules, allowing for an unimpeded escape of ejected Ag atoms. The relevance of these data with respect to surface sensitivity in secondary ion mass spectrometry is discussed.
AB - The ion beam-induced removal of thin water ice films condensed onto Ag and bombarded by energetic Au, Au2, Au3, and C60 projectiles is examined both experimentally and with molecular dynamics computer simulations. For water overlayers of thicknesses greater than 10, the yields of sputtered Ag+ secondary ions decay exponentially with increasing ice thickness, revealing characteristic decay lengths of 24, 20, 18, and 7.0, respectively. It is shown that these values manifest the characteristic depths of projectile energy loss, rather than escape depths of the sputtered Ag atoms through the water ice overlayer. Computer simulations show that the mechanism of ejection involves the sweeping away of overlayer water molecules, allowing for an unimpeded escape of ejected Ag atoms. The relevance of these data with respect to surface sensitivity in secondary ion mass spectrometry is discussed.
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U2 - 10.1103/PhysRevLett.96.216104
DO - 10.1103/PhysRevLett.96.216104
M3 - Article
C2 - 16803256
AN - SCOPUS:33744806368
SN - 0031-9007
VL - 96
JO - Physical review letters
JF - Physical review letters
IS - 21
M1 - 216104
ER -