Swift XRT Effective Area measured at the Panter end-to-end tests

G. Tagliaferri, A. Moretti, S. Campana, A. F. Abbey, R. M. Ambrosi, L. Angelini, A. Beardmore, H. Bräuninger, W. Burkert, D. N. Burrows, M. Capalbi, G. Chincarini, O. Citterio, G. Cusumano, M. J. Freyberg, P. Giommi, G. D. Hartner, J. E. Hill, K. Mori, D. MorrisK. Mukerjee, J. A. Nousek, J. Osborne, A. D.T. Short, F. Tamburelli, D. J. Watson, A. Wells

Research output: Contribution to journalConference articlepeer-review

10 Scopus citations


The Swift X-ray Telescope (XRT) is designed to make astrometric, spectroscopic and photometric observations of the X-ray emission from Gamma-ray bursts and their afterglows, in the energy band 0.2-10 keV. Here we report first results of the analysis of Swift XRT effective area at five different energies as measured during the end-to-end calibration campaign at the Panter X-ray beam line facility. The analysis comprises the study of the effective area both on-axis and off-axis for different event grade selection. We compare the laboratory results with the expectations and show that the measured effective area meets the mission scientific requirements.

Original languageEnglish (US)
Pages (from-to)241-250
Number of pages10
JournalProceedings of SPIE - The International Society for Optical Engineering
StatePublished - 2004
EventX-Ray and Gamma-Ray Instrumentation for Astronomy XIII - San Diego, CA, United States
Duration: Aug 3 2003Aug 5 2003

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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