Abstract
The Swift X-ray Telescope (XRT) is designed to make astrometric, spectroscopic and photometric observations of the X-ray emission from Gamma-ray bursts and their afterglows, in the energy band 0.2-10 keV. Here we report first results of the analysis of Swift XRT effective area at five different energies as measured during the end-to-end calibration campaign at the Panter X-ray beam line facility. The analysis comprises the study of the effective area both on-axis and off-axis for different event grade selection. We compare the laboratory results with the expectations and show that the measured effective area meets the mission scientific requirements.
Original language | English (US) |
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Pages (from-to) | 241-250 |
Number of pages | 10 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 5165 |
DOIs | |
State | Published - 2004 |
Event | X-Ray and Gamma-Ray Instrumentation for Astronomy XIII - San Diego, CA, United States Duration: Aug 3 2003 → Aug 5 2003 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering