TY - GEN
T1 - Symbolic dynamics of wavelet images for pattern identification
AU - Jin, Xin
AU - Gupta, Shalabh
AU - Mukherjee, Kushal
AU - Ray, Asok
N1 - Copyright:
Copyright 2010 Elsevier B.V., All rights reserved.
PY - 2010
Y1 - 2010
N2 - Symbolic time series analysis has been introduced in recent literature for pattern identification in dynamical systems. Relevant information, embedded in the measured time series, is extracted in the form of symbol sequences by partitioning of the data sets, and probabilistic finite state automata are constructed from these symbol sequences to generate pattern vectors. This paper presents a symbolic pattern identification method by partitioning of two-dimensional wavelet (i.e., scale-shift) images of sensor time series data. The proposed method is experimentally validated on a laboratory apparatus for identification of evolving patterns due to fatigue damage in polycrystalline alloy specimens.
AB - Symbolic time series analysis has been introduced in recent literature for pattern identification in dynamical systems. Relevant information, embedded in the measured time series, is extracted in the form of symbol sequences by partitioning of the data sets, and probabilistic finite state automata are constructed from these symbol sequences to generate pattern vectors. This paper presents a symbolic pattern identification method by partitioning of two-dimensional wavelet (i.e., scale-shift) images of sensor time series data. The proposed method is experimentally validated on a laboratory apparatus for identification of evolving patterns due to fatigue damage in polycrystalline alloy specimens.
UR - https://www.scopus.com/pages/publications/77957757449
UR - https://www.scopus.com/inward/citedby.url?scp=77957757449&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:77957757449
SN - 9781424474264
T3 - Proceedings of the 2010 American Control Conference, ACC 2010
SP - 3481
EP - 3486
BT - Proceedings of the 2010 American Control Conference, ACC 2010
T2 - 2010 American Control Conference, ACC 2010
Y2 - 30 June 2010 through 2 July 2010
ER -