Synchrotron X-ray metrology of dopant distribution and oxidation state in high pressure CVD grown TM2+:ZnSe optical fibers

Michael G. Coco, Stephen C. Aro, Alexander Hendrickson, James P. Krug, Barry Lai, Zhonghou Cai, Pier J. Sazio, Sean A. Mcdaniel, Gary Cook, Venkatraman Gopalan, John V. Badding

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Engineering & Materials Science

Chemical Compounds