TY - GEN
T1 - Synthesis and diagnosis of RF filters in Liquid Crystalline Polymer (LCP) substrate
AU - Mukherjee, Souvik
AU - Swaminathan, Madhavan
AU - Dalmia, Sidharth
PY - 2005
Y1 - 2005
N2 - Fault detection and diagnosis of RF circuits after fabrication is a time-consuming step in the manufacturing cycle. This paper presents the application of layout-level synthesis technique to the diagnosis of RF bandpass filters with embedded passives in LCP substrate. The proposed approach is based on a combination of segmented lumped circuit modeling, nonlinear mapping using polynomial functions and circuit level optimization. Bandpass filters for different electrical specifications were synthesized and fabricated. The results of synthesis are within 5% of EM measurement data. The fabricated designs require diagnosis of variations in performance metrics such as center frequency, bandwidth and transmission zeros that occurred due to process variations. Synthesis was applied to map the variations in electrical parameters to component geometries. The synthesized results predict the possible variations in physical parameters that have been confirmed with measurements of the fabricated devices.
AB - Fault detection and diagnosis of RF circuits after fabrication is a time-consuming step in the manufacturing cycle. This paper presents the application of layout-level synthesis technique to the diagnosis of RF bandpass filters with embedded passives in LCP substrate. The proposed approach is based on a combination of segmented lumped circuit modeling, nonlinear mapping using polynomial functions and circuit level optimization. Bandpass filters for different electrical specifications were synthesized and fabricated. The results of synthesis are within 5% of EM measurement data. The fabricated designs require diagnosis of variations in performance metrics such as center frequency, bandwidth and transmission zeros that occurred due to process variations. Synthesis was applied to map the variations in electrical parameters to component geometries. The synthesized results predict the possible variations in physical parameters that have been confirmed with measurements of the fabricated devices.
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U2 - 10.1109/MWSYM.2005.1517187
DO - 10.1109/MWSYM.2005.1517187
M3 - Conference contribution
AN - SCOPUS:33749268371
SN - 0780388461
SN - 9780780388468
T3 - IEEE MTT-S International Microwave Symposium Digest
SP - 2199
EP - 2202
BT - 2005 IEEE MTT-S International Microwave Symposium Digest
T2 - 2005 IEEE MTT-S International Microwave Symposium
Y2 - 12 June 2005 through 17 June 2005
ER -