System life data analysis with dependent partial knowledge on the exact cause of system failure

Dennis K.J. Lin; Frank M. Guess

doi:10.1016/0026-2714(94)90092-2

System life data analysis with dependent partial knowledge on the exact cause of system failure

Dennis K.J. Lin
, Frank M. Guess

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45 Scopus citations

Abstract

Because of cost and time factors the exact cause of system failure may be known only partially. For example, the cause is narrowed down to a component in a subsystem or a smaller set of components. This is called "masking" of the exact failure mode. Our paper focuses on reliability estimation when the masking probability is dependent on the particular cause of failure.

Original language	English (US)
Pages (from-to)	535-544
Number of pages	10
Journal	Microelectronics Reliability
Volume	34
Issue number	3
DOIs	https://doi.org/10.1016/0026-2714(94)90092-2
State	Published - Mar 1994

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Safety, Risk, Reliability and Quality
Condensed Matter Physics
Surfaces, Coatings and Films
Electrical and Electronic Engineering

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10.1016/0026-2714(94)90092-2

Cite this

@article{fb90ce41218944f99421cff4cfdb46e5,

title = "System life data analysis with dependent partial knowledge on the exact cause of system failure",

abstract = "Because of cost and time factors the exact cause of system failure may be known only partially. For example, the cause is narrowed down to a component in a subsystem or a smaller set of components. This is called {"}masking{"} of the exact failure mode. Our paper focuses on reliability estimation when the masking probability is dependent on the particular cause of failure.",

author = "Lin, \{Dennis K.J.\} and Guess, \{Frank M.\}",

year = "1994",

month = mar,

doi = "10.1016/0026-2714(94)90092-2",

language = "English (US)",

volume = "34",

pages = "535--544",

journal = "Microelectronics Reliability",

issn = "0026-2714",

publisher = "Elsevier Ltd",

number = "3",

}

TY - JOUR

T1 - System life data analysis with dependent partial knowledge on the exact cause of system failure

AU - Lin, Dennis K.J.

AU - Guess, Frank M.

PY - 1994/3

Y1 - 1994/3

N2 - Because of cost and time factors the exact cause of system failure may be known only partially. For example, the cause is narrowed down to a component in a subsystem or a smaller set of components. This is called "masking" of the exact failure mode. Our paper focuses on reliability estimation when the masking probability is dependent on the particular cause of failure.

AB - Because of cost and time factors the exact cause of system failure may be known only partially. For example, the cause is narrowed down to a component in a subsystem or a smaller set of components. This is called "masking" of the exact failure mode. Our paper focuses on reliability estimation when the masking probability is dependent on the particular cause of failure.

UR - https://www.scopus.com/pages/publications/0028392181

UR - https://www.scopus.com/pages/publications/0028392181#tab=citedBy

U2 - 10.1016/0026-2714(94)90092-2

DO - 10.1016/0026-2714(94)90092-2

M3 - Article

AN - SCOPUS:0028392181

SN - 0026-2714

VL - 34

SP - 535

EP - 544

JO - Microelectronics Reliability

JF - Microelectronics Reliability

IS - 3

ER -

System life data analysis with dependent partial knowledge on the exact cause of system failure

Abstract

All Science Journal Classification (ASJC) codes

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