TabLog: Test-Time Adaptation for Tabular Data Using Logic Rules

Weijieying Ren, Xiaoting Li, Huiyuan Chen, Vineeth Rakesh, Zhuoyi Wang, Mahashweta Das, Vasant Honavar

Research output: Contribution to journalConference articlepeer-review

Abstract

We consider the problem of test-time adaptation of predictive models trained on tabular data. Effective solution of this problem requires adaptation of predictive models trained on the source domain to a target domain, using only unlabeled target domain data, without access to source domain data. Existing test-time adaptation methods for tabular data have difficulty coping with the heterogeneous features and their complex dependencies inherent in tabular data. To overcome these limitations, we consider test-time adaptation in the setting wherein the logical structure of the rules is assumed to remain invariant despite distribution shift between source and target domains whereas the numerical parameters associated with the rules and the weights assigned to them can vary to accommodate distribution shift. TabLog discretizes numerical features, models dependencies between heterogeneous features, introduces a novel contrastive loss for coping with distribution shift, and presents an end-to-end framework for efficient training and test-time adaptation by taking advantage of a logical neural network representation of a rule ensemble. We present results of experiments using several benchmark data sets that demonstrate TabLog is competitive with or improves upon the state-of-the-art methods for test-time adaptation of predictive models trained on tabular data. Our code is available at https://github.com/WeijieyingRen/TabLog.

Original languageEnglish (US)
Pages (from-to)42417-42427
Number of pages11
JournalProceedings of Machine Learning Research
Volume235
StatePublished - 2024
Event41st International Conference on Machine Learning, ICML 2024 - Vienna, Austria
Duration: Jul 21 2024Jul 27 2024

All Science Journal Classification (ASJC) codes

  • Artificial Intelligence
  • Software
  • Control and Systems Engineering
  • Statistics and Probability

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