TY - GEN
T1 - Tailored single crystal orientations for improved tonpilz transducer performance
AU - Snook, Kevin A.
AU - Rehrig, Paul W.
AU - Hackenberger, Wesley S.
AU - Meyer, Richard J.
AU - Markley, Douglas
PY - 2006/12/1
Y1 - 2006/12/1
N2 - Various transverse length extensional modes of single crystal piezoelectrics were evaluated for high power capabilities and compared with the longitudinal "33" mode. Both bar and tube geometries, and d 31 and d32 piezoelectric modes were explored. The elastic, piezoelectric and dielectric properties were evaluated under dynamic conditions using a matrix of stress, temperature and electric field conditions. Cristallographic orientation significantly affected domain stability; poling along the 〈001〉 axis showed a higher phase transition point, relative to stress and temperature, than the 〈110〉 orientation. The optimized transverse mode (d31) showed significantly improved properties due to the orthogonal relationship between electric field and pre-stress; strains over 0.2% were recorded.
AB - Various transverse length extensional modes of single crystal piezoelectrics were evaluated for high power capabilities and compared with the longitudinal "33" mode. Both bar and tube geometries, and d 31 and d32 piezoelectric modes were explored. The elastic, piezoelectric and dielectric properties were evaluated under dynamic conditions using a matrix of stress, temperature and electric field conditions. Cristallographic orientation significantly affected domain stability; poling along the 〈001〉 axis showed a higher phase transition point, relative to stress and temperature, than the 〈110〉 orientation. The optimized transverse mode (d31) showed significantly improved properties due to the orthogonal relationship between electric field and pre-stress; strains over 0.2% were recorded.
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U2 - 10.1109/ULTSYM.2006.104
DO - 10.1109/ULTSYM.2006.104
M3 - Conference contribution
AN - SCOPUS:47249148895
SN - 1424402018
SN - 9781424402014
T3 - Proceedings - IEEE Ultrasonics Symposium
SP - 359
EP - 362
BT - 2006 IEEE International Ultrasonics Symposium, IUS
T2 - 2006 IEEE International Ultrasonics Symposium, IUS
Y2 - 3 October 2006 through 6 October 2006
ER -