Target and projectile cross sections for F ions on Ti, V, Cr, Fe, and Co: 1.7 MeV/amu

Ann Schmiedekamp, Tom J. Gray, B. L. Doyle, U. Schiebel

Research output: Contribution to journalArticlepeer-review

24 Scopus citations


Measurements of the target-thickness dependences of the target K x-ray production yields are reported for 1.7-MeV/amu Fq+ (q=6,8 and 9) ions incident upon thin solid targets of elements from Ti to Co. Target K x-ray production cross sections were extracted in the limit of vanishing target thickness. Comparisons of the data to theoretical estimates based upon combinations of direct ionization and electron-transfer processes are presented. Projectile K-vacancy production and quenching cross sections were obtained from the three-component model for the target K x-ray data as a function of foil thickness. Comparisons of the projectile parameters to theoretical estimates based upon electron transfer, direct ionization, and excitation processes are presented.

Original languageEnglish (US)
Pages (from-to)2167-2172
Number of pages6
JournalPhysical Review A
Issue number6
StatePublished - 1979

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics


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