Abstract
Measurements of the target-thickness dependences of the target K x-ray production yields are reported for 1.7-MeV/amu Fq+ (q=6,8 and 9) ions incident upon thin solid targets of elements from Ti to Co. Target K x-ray production cross sections were extracted in the limit of vanishing target thickness. Comparisons of the data to theoretical estimates based upon combinations of direct ionization and electron-transfer processes are presented. Projectile K-vacancy production and quenching cross sections were obtained from the three-component model for the target K x-ray data as a function of foil thickness. Comparisons of the projectile parameters to theoretical estimates based upon electron transfer, direct ionization, and excitation processes are presented.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 2167-2172 |
| Number of pages | 6 |
| Journal | Physical Review A - Atomic, Molecular, and Optical Physics |
| Volume | 19 |
| Issue number | 6 |
| DOIs | |
| State | Published - 1979 |
All Science Journal Classification (ASJC) codes
- Atomic and Molecular Physics, and Optics
Fingerprint
Dive into the research topics of 'Target and projectile cross sections for F ions on Ti, V, Cr, Fe, and Co: 1.7 MeV/amu'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver