Technical and scientific developments in exposure marker methodology
- Eric J. Sampson
- , Larry L. Needham
- , James L. Pirkle
- , W. Harry Hannon
- , Dayton T. Miller
- , Donald G. Patterson
- , John T. Bernert
- , David L. Ashley
- , Robert H. Hill
- , Elaine W. Gunter
- , Daniel C. Paschal
- , Francis W. Spierto
- , Michael J. Rich
Research output: Contribution to journal › Article › peer-review
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