Skip to main navigation
Skip to search
Skip to main content
Penn State Home
Help & FAQ
Link opens in a new tab
Search content at Penn State
Home
Researchers
Research output
Research units
Equipment
Grants & Projects
Prizes
Activities
Temperature dependence of electrical breakdown in polymer dielectrics
Cheolhong Min
,
Michael T. Lanagan
, Thomas R. Shrout
Engineering Science and Mechanics
Materials Research Institute (MRI)
Research output
:
Chapter in Book/Report/Conference proceeding
›
Conference contribution
Overview
Fingerprint
Fingerprint
Dive into the research topics of 'Temperature dependence of electrical breakdown in polymer dielectrics'. Together they form a unique fingerprint.
Sort by
Weight
Alphabetically
Keyphrases
Polymer Dielectrics
100%
Temperature Dependence
100%
Electrical Breakdown
100%
Polypropylene
50%
Breakdown Field
50%
Temperature Range
50%
Dielectric Properties
50%
Temperature Rise
50%
Weibull Modulus
50%
Polyimide
50%
Breakdown Strength
50%
High-voltage Performance
50%
Power Electronic Converters
50%
High Temperature Degradation
50%
Dielectric Breakdown Mechanism
50%
Engineering
Dielectrics
100%
Temperature Dependence
100%
Polymer
100%
Temperature Range
33%
Breakdown Field
33%
Weibull Modulus
33%
Power Electronic Converter
33%
Polymer film capacitor
33%
Material Science
Electrical Breakdown
100%
Polymer
100%
Dielectric Material
100%
Dielectric Property
33%
Capacitor
33%
Polypropylene
33%
Polymer Films
33%
Polyimide
33%