Temperature dependence of optical wavelength shift as a validation technique for pulsed laser diode array thermal modeling

As with any electronic device, the performance and reliability of laser diode arrays (LD.Vs) is a strong function of the temperature at which the array operates. However, the electrical and optical environment in which the LDA operates makes direct temperature measurements difficult. Wavelength measurements can be used as a means to deduce temperature by exploiting the linear relationship between wavelength and laser diode operating temperature. The process by which wavelength measurements are translated into temperature is discussed and experimental results using this methodology are shown. A wide range of information about both the transient and steady state thermal performance of LDA's can be acquired from such experimental measurements. These experimental results are compared with simulated numerical temperatures as a means to validate the simulation.