Temperature dependence of the piezoelectric response in lead zirconate titanate films

R. A. Wolf; S. Trolier-McKinstry

doi:10.1063/1.1636530

Temperature dependence of the piezoelectric response in lead zirconate titanate films

R. A. Wolf
, S. Trolier-McKinstry

Research output: Contribution to journal › Article › peer-review

181 Scopus citations

Abstract

The wafer fleure technique was modified to allow measurement of the e_31f coefficient of films as a function of temperature between -55 and 85°C. Within films of a given composition, the thickest films exhibited the highest temperature dependences. This paper discusses and identifies the potential contributors to the measured variation in electromechanical response of the PZT films between -55 and 85°C.

Original language	English (US)
Pages (from-to)	1397-1406
Number of pages	10
Journal	Journal of Applied Physics
Volume	95
Issue number	3
DOIs	https://doi.org/10.1063/1.1636530
State	Published - Feb 1 2004

All Science Journal Classification (ASJC) codes

General Physics and Astronomy

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10.1063/1.1636530

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title = "Temperature dependence of the piezoelectric response in lead zirconate titanate films",

abstract = "The wafer fleure technique was modified to allow measurement of the e31f coefficient of films as a function of temperature between -55 and 85°C. Within films of a given composition, the thickest films exhibited the highest temperature dependences. This paper discusses and identifies the potential contributors to the measured variation in electromechanical response of the PZT films between -55 and 85°C.",

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N2 - The wafer fleure technique was modified to allow measurement of the e31f coefficient of films as a function of temperature between -55 and 85°C. Within films of a given composition, the thickest films exhibited the highest temperature dependences. This paper discusses and identifies the potential contributors to the measured variation in electromechanical response of the PZT films between -55 and 85°C.

AB - The wafer fleure technique was modified to allow measurement of the e31f coefficient of films as a function of temperature between -55 and 85°C. Within films of a given composition, the thickest films exhibited the highest temperature dependences. This paper discusses and identifies the potential contributors to the measured variation in electromechanical response of the PZT films between -55 and 85°C.

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Temperature dependence of the piezoelectric response in lead zirconate titanate films

Abstract

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