Temperature dependence of three-dimensional domain wall arrangement in ferroelectric K0.9Na0.1NbO3epitaxial thin films

Martin Schmidbauer, Laura Bogula, Bo Wang, Michael Hanke, Leonard Von Helden, Adriana Ladera, Jian Jun Wang, Long Qing Chen, Jutta Schwarzkopf

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

The three-dimensional arrangement and orientation of domain walls in ferroelectric K0.9Na0.1NbO3/(110)NdScO3 epitaxial thin films were investigated at different temperatures both experimentally by means of piezoresponse force microscopy and three-dimensional x-ray diffraction and theoretically by three-dimensional phase-field simulations. At room temperature, a well-ordered herringbone-like domain pattern appears in which there is a periodic arrangement of a1a2/MC monoclinic phases. Four different types of domain walls are observed, which can be characterized by out-of-plane tilt angles of ±45° and in-plane twist angles of ±21°. For the orthorhombic high-temperature phase, a periodic a1/a2 stripe domain pattern with exclusive in-plane polarization is formed. Here, two different types of domain walls are observed, both of them having a fixed out-of-plane domain wall angle of 90° but distinguished by different in-plane twist angles of ±45°. The experimental results are fully consistent with three-dimensional phase-field simulations using anisotropic misfit strains. The qualitative agreement between the experiment and the theory applies, in particular, to the wide phase transition range between about 180 °C and 260 °C. In this temperature range, a complex interplay of coexisting monoclinic a1a2/MC and orthorhombic a1/a2 phases takes place.

Original languageEnglish (US)
Article number184101
JournalJournal of Applied Physics
Volume128
Issue number18
DOIs
StatePublished - Nov 14 2020

All Science Journal Classification (ASJC) codes

  • General Physics and Astronomy

Fingerprint

Dive into the research topics of 'Temperature dependence of three-dimensional domain wall arrangement in ferroelectric K0.9Na0.1NbO3epitaxial thin films'. Together they form a unique fingerprint.

Cite this