Test generation and fault localization for quantum circuits

Marek Perkowski; Jacob Biamonte; Martin Lukac

Test generation and fault localization for quantum circuits

Marek Perkowski, Jacob Biamonte, Martin Lukac

Mathematics

Research output: Contribution to journal › Conference article › peer-review

31 Scopus citations

Abstract

It is believed that quantum computing will begin to have a practical impact in industry around year 2010. We propose an approach to test generation and fault localization for a wide category of fault models. While in general we follow the methods used in test of standard circuits, there are two significant differences: (2) we use both deterministic and probabilistic tests to detect faults, (2) we use special measurement gates to determine the internal states. A Fault Table is created that includes probabilistic information. "Probabilistic set covering" and "probabilistic adaptive trees" that generalize those known in standard circuits, are next used.

Original language	English (US)
Pages (from-to)	62-68
Number of pages	7
Journal	Proceedings of The International Symposium on Multiple-Valued Logic
State	Published - 2005
Event	35th International Symposium on Multiple-Valued Logic, ISMVL 2005 - Calgary, Alta., Canada Duration: May 19 2005 → May 21 2005

All Science Journal Classification (ASJC) codes

General Computer Science
General Mathematics

Cite this

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journal = "Proceedings of The International Symposium on Multiple-Valued Logic",

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note = "35th International Symposium on Multiple-Valued Logic, ISMVL 2005 ; Conference date: 19-05-2005 Through 21-05-2005",

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T1 - Test generation and fault localization for quantum circuits

AU - Perkowski, Marek

AU - Biamonte, Jacob

AU - Lukac, Martin

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AB - It is believed that quantum computing will begin to have a practical impact in industry around year 2010. We propose an approach to test generation and fault localization for a wide category of fault models. While in general we follow the methods used in test of standard circuits, there are two significant differences: (2) we use both deterministic and probabilistic tests to detect faults, (2) we use special measurement gates to determine the internal states. A Fault Table is created that includes probabilistic information. "Probabilistic set covering" and "probabilistic adaptive trees" that generalize those known in standard circuits, are next used.

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M3 - Conference article

AN - SCOPUS:24644492246

SN - 0195-623X

SP - 62

EP - 68

JO - Proceedings of The International Symposium on Multiple-Valued Logic

JF - Proceedings of The International Symposium on Multiple-Valued Logic

T2 - 35th International Symposium on Multiple-Valued Logic, ISMVL 2005

Y2 - 19 May 2005 through 21 May 2005

ER -

Test generation and fault localization for quantum circuits

Abstract

All Science Journal Classification (ASJC) codes

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