Testing neutron-induced soft errors in semiconductor memory, invited

Research output: Contribution to journal › Conference article › peer-review

Original language	English (US)
Pages (from-to)	825-826
Number of pages	2
Journal	Transactions of the American Nuclear Society
Volume	91
State	Published - 2004
Event	2004 Winter Meeting - American Nuclear Society - Washington, D.C., United States Duration: Nov 14 2004 → Nov 18 2004

All Science Journal Classification (ASJC) codes

@article{7633f074174340158e4bdee5beb8d572,

title = "Testing neutron-induced soft errors in semiconductor memory, invited",

author = "K. {\"U}nl{\"u} and {\c C}etiner, \{S. M.\} and V. Degalahal and N. Vijaykrishnan and Irwin, \{M. J.\}",

year = "2004",

language = "English (US)",

volume = "91",

pages = "825--826",

journal = "Transactions of the American Nuclear Society",

issn = "0003-018X",

publisher = "American Nuclear Society",

note = "2004 Winter Meeting - American Nuclear Society ; Conference date: 14-11-2004 Through 18-11-2004",

}

TY - JOUR

T1 - Testing neutron-induced soft errors in semiconductor memory, invited

AU - Ünlü, K.

AU - Çetiner, S. M.

AU - Degalahal, V.

AU - Vijaykrishnan, N.

AU - Irwin, M. J.

PY - 2004

Y1 - 2004

UR - https://www.scopus.com/pages/publications/33244470405

UR - https://www.scopus.com/pages/publications/33244470405#tab=citedBy

M3 - Conference article

AN - SCOPUS:33244470405

SN - 0003-018X

VL - 91

SP - 825

EP - 826

JO - Transactions of the American Nuclear Society

JF - Transactions of the American Nuclear Society

T2 - 2004 Winter Meeting - American Nuclear Society

Y2 - 14 November 2004 through 18 November 2004

ER -