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The dependence of UMOSFET characteristics and reliability on geometry and processing
S. A. Suliman, N. Gollagunta, L. Trabzon, J. Hao, R. S. Ridley, C. M. Knoedler, G. M. Dolny, O. O. Awadelkarim, S. J. Fonash
Research output: Contribution to journal › Article › peer-review
9
Scopus
citations