TY - JOUR
T1 - The effect of filament diameter on je in high filament count bi2212/ag round wire
AU - Nachtrab, William T.
AU - Wong, Terence
AU - Liu, Xiaotao T.
AU - Schwartz, Justin
N1 - Funding Information:
Manuscript received August 21, 2008. First published June 30, 2009; current version published July 15, 2009. This work was supported in part by the NIH-National Cancer Institute under Grant 4R44CA110117-03. W. T. Nachtrab and T. Wong are with Supercon, Inc., Shrewsbury, MA 01545 USA (e-mail: [email protected]). X. T. Liu and J. Schwartz are with the National High Magnetic Field Laboratory, Tallahassee, FL 32310 USA and the College of Engineering, Florida A&M University Florida State University , FL 32310USA (e-mail: schwartz@magnet. fsu.edu). Color versions of one or more of the figures in this paper are available online at http://ieeexplore.ieee.org. Digital Object Identifier 10.1109/TASC.2009.2018213
PY - 2009/6
Y1 - 2009/6
N2 - In this study, we investigated the effect of filament size on Je for high filament count Bi2212 round wire conductors partial melt processed with Tmax between 882 and 890° C in pure oxygen. The filament size that produced maximum Je was between 12 and 15 μm depending on conductor design and Tmax. When the filament size was below 12 μm the filaments were unstable during partial melt processing leading to a break-up in the structure of the filament array and low Je. This effect is attributed the formation of interconnects between filaments which leads to coarsening driven by a reduction in interfacial surface energy
AB - In this study, we investigated the effect of filament size on Je for high filament count Bi2212 round wire conductors partial melt processed with Tmax between 882 and 890° C in pure oxygen. The filament size that produced maximum Je was between 12 and 15 μm depending on conductor design and Tmax. When the filament size was below 12 μm the filaments were unstable during partial melt processing leading to a break-up in the structure of the filament array and low Je. This effect is attributed the formation of interconnects between filaments which leads to coarsening driven by a reduction in interfacial surface energy
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U2 - 10.1109/TASC.2009.2018213
DO - 10.1109/TASC.2009.2018213
M3 - Article
AN - SCOPUS:68649107847
SN - 1051-8223
VL - 19
SP - 3061
EP - 3066
JO - IEEE Transactions on Applied Superconductivity
JF - IEEE Transactions on Applied Superconductivity
IS - 3
M1 - 5153166
ER -