Abstract
YBaCuO thin films have been deposited on various single-crystal substrates (Al2O3, MgO, SrTiO3, ZrO2(Y)) by hollow cathode sputtering at various substrate temperatures, Ts. The growth has been studied by X-ray diffraction and channelling techniques. At Ts around 800°C the films have a highly textured growth with the c axis perpendicular to the substrate surface on all substrates, but only on MgO and SrTiO3 is epitaxial growth observed. Besides the substrate material, Ts strongly influences the growth of the films. Epitaxial growth correlates with high critical current values (up to 5.5 × 106 A cm-2 at 77 K) in the films.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 357-362 |
| Number of pages | 6 |
| Journal | Journal of the Less-Common Metals |
| Volume | 151 |
| Issue number | C |
| DOIs | |
| State | Published - May 15 1989 |
All Science Journal Classification (ASJC) codes
- General Engineering
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