The impact of mechanical stress on the degradation of AlGaN/GaN high electron mobility transistors

Keyphrases

• Mechanical Stress 100%
• GaN HEMT 100%
• AlGaN-GaN 100%
• Total Stress 66%
• Transistor Device 33%
• High Electron Mobility Transistor 33%
• Stress Components 33%
• Growth Method 33%
• Thermomechanical Simulation 33%
• Bias Conditions 33%
• Combined Analysis 33%
• Actual Device 33%
• Device Degradation 33%

Material Science

• Transistor 100%
• Electron Mobility 100%
• Mechanical Stress 100%
• Piezoelectricity 33%
• Stress Analysis 33%

Engineering

• Mechanical Stress 100%
• Piezoelectric 33%
• Stress Component 33%
• Growth Method 33%