The impact of trench geometry and processing on the performance and reliability of low voltage power UMOSFETs

S. A. Suliman, N. Gallogunta, L. Trabzon, J. Hao, G. Dolny, R. Ridley, T. Grebs, J. Benjamin, C. Kocon, J. Zeng, C. M. Knoedler, M. Horn, O. O. Awadelkarim, S. J. Fonash, J. Ruzyllo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations

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Engineering & Materials Science