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The impact of trench geometry and processing on the performance and reliability of low voltage power UMOSFETs
S. A. Suliman, N. Gallogunta, L. Trabzon, J. Hao, G. Dolny, R. Ridley, T. Grebs, J. Benjamin, C. Kocon, J. Zeng, C. M. Knoedler, M. Horn, O. O. Awadelkarim, S. J. Fonash, J. Ruzyllo
Research output: Contribution to journal › Article › peer-review
5
Scopus
citations