The NEID Port Adapter at WIYN: On-sky Fast Guiding Performance

Dan Li, Sarah E. Logsdon, William McBride, Jayadev Rajagopal, Marsha J. Wolf, Jeffrey W. Percival, Kurt P. Jaehnig, Michael P. Smith, Qian Gong, Michael W. McElwain, Heidi Schweiker, Eli Golub, Jesus Higuera, Jessica Klusmeyer, Emily Hunting, Erik Timmermann, Mark Everett, Wilson Liu, Susan Ridgway, Ming LiangChristian Schwab, Suvrath Mahadevan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations


NEID (NN-explore Exoplanet Investigations with Doppler spectroscopy) is an optical, fiber-fed spectrometer installed on the WIYN 3.5m Telescope. The radial velocity precision that NEID is expected to reach requires the stellar jitter (i.e., the slight irregular movement of the stellar image induced by atmospheric turbulence, wind-shake, etc.) to be controlled within 0.05 arc-seconds 90% of the time in nominal observing conditions (i.e., 0.8-arcsecond seeing and mild winds). To achieve that, the NEID Port Adapter incorporates a fast, first-order wavefront correction system, which implements an Electron-Multiplying CCD camera and a tip/tilt piezo stage to capture and stabilize the stellar image. Here, we use on-sky data to demonstrate the performance of this system under various observing conditions.

Original languageEnglish (US)
Title of host publicationGround-based and Airborne Instrumentation for Astronomy IX
EditorsChristopher J. Evans, Julia J. Bryant, Kentaro Motohara
ISBN (Electronic)9781510653498
StatePublished - 2022
EventGround-based and Airborne Instrumentation for Astronomy IX 2022 - Montreal, Canada
Duration: Jul 17 2022Jul 22 2022

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X


ConferenceGround-based and Airborne Instrumentation for Astronomy IX 2022

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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