The Position Dependence of Electron Beam Induced Effects in 2D Materials with Deep Neural Networks

Kevin M. Roccapriore; Max Schwarzer; Joshua Greaves; Jesse Farebrother; Riccardo Torsi; Rishabh Agarwal; Colton Bishop; Igor Mordatch; Ekin D. Cubuk; Aaron Courville; Marc G. Bellemare; Joshua Robinson; Pablo Samuel Castro; Sergei V. Kalinin

doi:10.1093/mam/ozae044.190

The Position Dependence of Electron Beam Induced Effects in 2D Materials with Deep Neural Networks

Kevin M. Roccapriore
, Max Schwarzer
, Joshua Greaves
, Jesse Farebrother
, Riccardo Torsi
, Rishabh Agarwal
, Colton Bishop
, Igor Mordatch
, Ekin D. Cubuk
, Aaron Courville
, Marc G. Bellemare
, Joshua Robinson
, Pablo Samuel Castro
, Sergei V. Kalinin

Research output: Contribution to journal › Conference article › peer-review

Original language	English (US)
Pages (from-to)	416-417
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	30
Issue number	2024
DOIs	https://doi.org/10.1093/mam/ozae044.190
State	Published - Jul 24 2024
Event	82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 - Cleveland, United States Duration: Jul 28 2024 → Aug 1 2024

All Science Journal Classification (ASJC) codes

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10.1093/mam/ozae044.190

Cite this

Roccapriore, K. M., Schwarzer, M., Greaves, J., Farebrother, J., Torsi, R., Agarwal, R., Bishop, C., Mordatch, I., Cubuk, E. D., Courville, A., Bellemare, M. G., Robinson, J., Castro, P. S., & Kalinin, S. V. (2024). The Position Dependence of Electron Beam Induced Effects in 2D Materials with Deep Neural Networks. Microscopy and Microanalysis, 30(2024), 416-417. https://doi.org/10.1093/mam/ozae044.190

@article{90594bf350df4c4abe4231b57fe64541,

title = "The Position Dependence of Electron Beam Induced Effects in 2D Materials with Deep Neural Networks",

author = "Roccapriore, \{Kevin M.\} and Max Schwarzer and Joshua Greaves and Jesse Farebrother and Riccardo Torsi and Rishabh Agarwal and Colton Bishop and Igor Mordatch and Cubuk, \{Ekin D.\} and Aaron Courville and Bellemare, \{Marc G.\} and Joshua Robinson and Castro, \{Pablo Samuel\} and Kalinin, \{Sergei V.\}",

year = "2024",

month = jul,

day = "24",

doi = "10.1093/mam/ozae044.190",

language = "English (US)",

volume = "30",

pages = "416--417",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "2024",

note = "82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 ; Conference date: 28-07-2024 Through 01-08-2024",

}

Roccapriore, KM, Schwarzer, M, Greaves, J, Farebrother, J, Torsi, R, Agarwal, R, Bishop, C, Mordatch, I, Cubuk, ED, Courville, A, Bellemare, MG, Robinson, J, Castro, PS & Kalinin, SV 2024, 'The Position Dependence of Electron Beam Induced Effects in 2D Materials with Deep Neural Networks', Microscopy and Microanalysis, vol. 30, no. 2024, pp. 416-417. https://doi.org/10.1093/mam/ozae044.190

TY - JOUR

T1 - The Position Dependence of Electron Beam Induced Effects in 2D Materials with Deep Neural Networks

AU - Roccapriore, Kevin M.

AU - Schwarzer, Max

AU - Greaves, Joshua

AU - Farebrother, Jesse

AU - Torsi, Riccardo

AU - Agarwal, Rishabh

AU - Bishop, Colton

AU - Mordatch, Igor

AU - Cubuk, Ekin D.

AU - Courville, Aaron

AU - Bellemare, Marc G.

AU - Robinson, Joshua

AU - Castro, Pablo Samuel

AU - Kalinin, Sergei V.

PY - 2024/7/24

Y1 - 2024/7/24

UR - https://www.scopus.com/pages/publications/85215672115

UR - https://www.scopus.com/pages/publications/85215672115#tab=citedBy

U2 - 10.1093/mam/ozae044.190

DO - 10.1093/mam/ozae044.190

M3 - Conference article

AN - SCOPUS:85215672115

SN - 1431-9276

VL - 30

SP - 416

EP - 417

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 2024

T2 - 82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024

Y2 - 28 July 2024 through 1 August 2024

ER -

The Position Dependence of Electron Beam Induced Effects in 2D Materials with Deep Neural Networks

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